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Hardware realization of a medical diagnostic system based on probabilistic CMOS (PCMOS) technology
Book chapter

Hardware realization of a medical diagnostic system based on probabilistic CMOS (PCMOS) technology

Zhi-Hui Kong, Jun-Jie Tan, B.E.S Akgul, Kiat-Seng Yeo, K.V Palem and Wang-Ling Goh
VLSI-DAT, IEEE International Symposium on VLSI Design, Automation and Test, 2008, pp.275-278
WTI-Frankfurt-digital GmbH
01/01/2008

Abstract

Bauelement Bayes-Verfahren Elektrodiagnostik Elektronik Energieverbrauch geringe Verlustleistung integrierte Schaltung komplementäre MOS-Schaltung Medizinelektronik medizinische Diagnostik Patientenüberwachung Rauschen Wahrscheinlichkeit
The continuous miniaturization of CMOS feature sizes into the nanometer regime has increasingly caused problems due to noise vulnerability, process variations, and energy consumption. Noise vulnerability and process variations have been recognized to cause statistical or probabilistic device behaviors. In this paper, by capitalizing on what most people termed as nuisance, we demonstrate how noise can be put to good use in CMOS devices. We present the first hardware implementation of a Bayesian medical diagnostic system for real-world patient monitoring using probabilistic CMOS (PCMOS). We explore ways to adapt Bayesian structure under realistic hardware constraints without compromising prediction accuracy. As compared to conventional CMOS, PCMOS implementation of the network offers noteworthy merits: ultra low-power consumption, high-speed performance and cost-effectiveness.

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