Abstract
Conference Title: 2015 IEEE International Symposium on Circuits and Systems (ISCAS) Conference Start Date: 2015, May 24 Conference End Date: 2015, May 27 Conference Location: Lisbon, Portugal Diminishing bitline sensing margin at low voltage condition is one of the most challenging design obstacles for reliable SRAM implementation in nano-scale CMOS technologies. This paper presents a self-biased design technique that improves the bitline sensing margin during the read operation by sourcing a current which is the same as the total leakage along each bitline. It is able to automatically track changes in supply voltage, operating temperature and die-to-die process variations. Furthermore, a 9T SRAM cell is utilized to ensure that bitline leakage is data-independent. Simulation and measurement results using 65 nm CMOS process show that the proposed technique enlarge the bitline swing over a wide range operating temperature and operates successfully down to the supply voltage of 0.18 V.