- Title
- A novel RFCMOS process monitoring test structure
- Creators - without role
- C. B Sia - Advanced RFIC (S) Pte Ltd 2 International Business Park, The Strategy, Tower 1 #10-11, Singapore 609930, SingaporeB. H Ong - Nanyang Technological UniversityK. M Lim - Advanced RFIC (S) Pte Ltd 2 International Business Park, The Strategy, Tower 1 #10-11, Singapore 609930, SingaporeK. S Yeo - Nanyang Technological UniversityM. A DO - Nanyang Technological UniversityJ. G MA - Nanyang Technological UniversityT Alam - Cascade Microtech (United States)ieee
- Publication Details
- ICMTS 2004 : proceedings of the 2004 International Conference on Microelectronic Test Structures : March 22-25, 2004, Awaji Yumebutai International Conference Center, Japan, pp.45-50
- Conference
- 2004 international conference on microelectronic test structures (March 22-25, 2004, Awaji Yumebutai International conference Center, Japan)
- Publisher
- IEEE
- Number of pages
- 6
- Identifiers
- 9912403409846
- Academic Unit
- Office of Provost
- Language
- English
- Resource Type
- Conference proceeding
Conference proceeding
A novel RFCMOS process monitoring test structure
ICMTS 2004 : proceedings of the 2004 International Conference on Microelectronic Test Structures : March 22-25, 2004, Awaji Yumebutai International Conference Center, Japan, pp.45-50
2004 international conference on microelectronic test structures (March 22-25, 2004, Awaji Yumebutai International conference Center, Japan)
2004
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