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An enhanced low-power high-speed Adder For Error-Tolerant application
Conference proceeding

An enhanced low-power high-speed Adder For Error-Tolerant application

Ning Zhu, Wang Ling Goh and Kiat Seng Yeo
Proceedings of the 2009 12th International Symposium on Integrated Circuits, pp.69-72
12/2009

Abstract

Adders Circuit testing Degradation Digital systems Electronic mail Energy consumption error-tolerance High speed integrated circuits Integrated circuit noise low power design Power engineering and energy Very large scale integration
The occurrence of errors are inevitable in modern VLSI technology and to overcome all possible errors is an expensive task. It not only consumes a lot of power but degrades the speed performance. By adopting an emerging concept in VLSI design and test-error-tolerance (ET), we managed to develop a novel error-tolerant adder which we named the Type II (ETAII). The circuit to some extent is able to ease the strict restriction on accuracy to achieve tremendous improvements in both the power consumption and speed performance. When compared to its conventional counterparts, the proposed ETAII is able to achieve more than 60% improvement in the power-delay product (PDP). The proposed ETAII is an enhancement of our earlier design, the ETAI, which has problem adding small number inputs.

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