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Coexistence of volatile and non-volatile resistive switching in 2D h-BN based electronic synapses
Conference proceeding

Coexistence of volatile and non-volatile resistive switching in 2D h-BN based electronic synapses

Y. Shi, C. Pan, V. Chen, N. Raghavan, K. L. Pey, F. M. Puglisi, E. Pop, H. -S. P. Wong, M. Lanza and IEEE
IEDM : 2017 IEEE International Electron Devices Meeting : 2-6 December 2017
IEEE International Electron Devices Meeting
01/01/2017

Abstract

Engineering Engineering, Electrical & Electronic Science & Technology Technology
We present the first fabrication of electronic synapses using two dimensional (2D) hexagonal boron nitride (h-BN) as active switching layer. The main advantage of these devices compared to the transition metal oxide (TMO) based counterparts is that multilayer h-BN stacks show both volatile and non-volatile resistive switching (RS) depending on the programming stresses applied, which allows implementing short-term (STP) and long-term plasticity (LTP) rules using a single device and without the need of complex architectures.

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