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DC-50 GHz Low Loss Switch Matrix Design in High Resistivity Trap-Rich SOI
Conference proceeding

DC-50 GHz Low Loss Switch Matrix Design in High Resistivity Trap-Rich SOI

Bo Yu, Kaixue Ma, Fanyi Meng, Thangarasu Bharatha Kumar, Kiat Seng Yeo and IEEE
International Symposium on Integrated Circuits
International Symposium on Integrated Circuits
01/01/2016

Abstract

Engineering Engineering, Electrical & Electronic Science & Technology Technology
This paper presents low insertion loss, high isolation, ultra wideband (DC to 50 GHz) 2 x 2 switch matrix in a 300mm 0.13 mu m high substrate resistivity trap- rich SOI. The switches are designed by using a series-shunt-series configuration with input and output matching networks. The designed switches achieve a 1.8 dB of low insertion loss and a high isolation of 38 dB up to 50 GHz. 1dB-compression point of designed switches are larger than 19 dBm from DC to 50 GHz. The active chip area of designed 2 x 2 switch matrix is only 0.28 x 0.21 mm(2).

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