Moment reversal characterization of thin magnetic film by VSM or AGFM

Z. S Shan; YINGFAN XU; J. P Wang; T. C Chong; S. S Malhotra; D. C Staffort; C. X Zhu

doi:10.1109/20.951016

Back

Conference proceeding

Moment reversal characterization of thin magnetic film by VSM or AGFM

Z. S Shan, YINGFAN XU, J. P Wang, T. C Chong, S. S Malhotra, D. C Staffort and C. X Zhu

IEEE transactions on magnetics, Vol.37(4), pp.1944-1946

Selected Papers from the Eighth Joint Magnetism and Magnetic Materials-International Magnetics Conference (MMM-Intermag), San Antonio, TX, January 7-11, 2001

01/07/2001

DOI: https://doi.org/10.1109/20.951016

Abstract

Condensed matter: electronic structure, electrical, magnetic, and optical properties

Exact sciences and technology

Magnetic properties and materials

Magnetic properties of monolayers and thin films

Magnetic properties of surface, thin films and multilayers

Physics

Metrics

1 Record Views

Details

Title: Moment reversal characterization of thin magnetic film by VSM or AGFM
Creators - without role: Z. S Shan - Data Storage Institute
YINGFAN XU - Data Storage Institute
J. P Wang - Data Storage Institute
T. C Chong - Data Storage Institute
S. S Malhotra - Data Storage Institute
D. C Staffort - Data Storage Institute
C. X Zhu - Komag Inc., San Jose, CA 95131, United States
Publication Details: IEEE transactions on magnetics, Vol.37(4), pp.1944-1946
Conference: Selected Papers from the Eighth Joint Magnetism and Magnetic Materials-International Magnetics Conference (MMM-Intermag), San Antonio, TX, January 7-11, 2001
Publisher: Institute of Electrical and Electronics Engineers
Number of pages: 3
Identifiers: 9911282909846
Academic Unit: Temasek Lab
Language: English
Resource Type: Conference proceeding

Moment reversal characterization of thin magnetic film by VSM or AGFM

Abstract

Metrics

Details

Singapore University of Technology and Design Social media