Probing the Electronic Structure of Defective Oxide: an EELS Approach

Conference proceeding

X. Li, G. Zhang, C. H. Tung, K. L. Pey and IEEE

2009 IEEE International Reliability Physics Symposium, pp.692-695

01/01/2009

Abstract

Computer Science

Computer Science, Theory & Methods

Engineering

Engineering, Electrical & Electronic

Physical Sciences

Physics

Physics, Multidisciplinary

Science & Technology

Technology

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Title: Probing the Electronic Structure of Defective Oxide: an EELS Approach
Creators - without role: X. Li - Nanyang Technological University
G. Zhang - Agency for Science, Technology and Research
C. H. Tung - Agency for Science, Technology and Research
K. L. Pey - Nanyang Technological University
IEEE
Publication Details: 2009 IEEE International Reliability Physics Symposium, pp.692-695
Publisher: IEEE
Number of pages: 3
Grant note: T206B1205; NTU RGM 12/07 / Ministry of Education Grant
Identifiers: 9914222209846
Academic Unit: Engineering Product Development (EPD); Temasek Lab
Language: English
Resource Type: Conference proceeding