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Quantitative analysis of micro-corrosion on magnetic recording disk using TOF SIMS
Conference proceeding

Quantitative analysis of micro-corrosion on magnetic recording disk using TOF SIMS

RONG JI, Thomas Liew and T. C Chong
IEEE transactions on magnetics, Vol.40(4), pp.3192-3194
Selected papers from the ninth joint magnetism and magnetic materials-international magnetics conference (MMM-Intermag): Anaheim, California, January 5-9 2004. Part II of two parts
01/07/2004

Abstract

Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology Magnetic properties and materials Physics

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