- Title
- Systematic direct parameter extraction with substrate network of SiGe HBT
- Creators - without role
- T HUI TEO - Singapore Science ParkYONG ZHONG Xiong - Institute of MicroelectronicsJeffrey SHIANG FU - Nanyang Technological UniversityHUAILIN Liao - Institute of MicroelectronicsJINGLIN Shi - Institute of MicroelectronicsMINGBIN YU - Institute of MicroelectronicsWEIHONG LI - Institute of MicroelectronicsTee Hui Teo - EPD Pillar
- Publication Details
- 2004 IEEE Radio Frequency Integrated Circuits Symposium, pp.603-606
- Conference
- 2004 IEEE radio frequency integrated circuits (RFIC) symposium (Fort Worth Convention Center, June 6-8, 2004)
- Publisher
- IEEE
- Number of pages
- 4
- Identifiers
- 9912414409846
- Academic Unit
- EPD Pillar
- Language
- English
- Resource Type
- Conference proceeding
Conference proceeding
Systematic direct parameter extraction with substrate network of SiGe HBT
2004 IEEE Radio Frequency Integrated Circuits Symposium, pp.603-606
2004 IEEE radio frequency integrated circuits (RFIC) symposium (Fort Worth Convention Center, June 6-8, 2004)
2004
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