Logo image
Top-Down and Bottom-Up Approaches to High-Density Bit-Patterned Media
Conference proceeding

Top-Down and Bottom-Up Approaches to High-Density Bit-Patterned Media

Joel K. W. Yang, Mohamed Asbahi, Naganivetha Thiyagarajah, Yunjie Chen, Siang Huei Leong, Vivian Ng and IEEE
2012 Asia-Pacific Magnetic Recording Conference, pp.1-2
01/01/2012

Abstract

Computer Science Computer Science, Theory & Methods Engineering Engineering, Electrical & Electronic Science & Technology Technology
We develop processes relevant to bit patterned media (BPM) to achieve nanostructures with densities of up to 4.4 Tdots/in(2) using a combination of top-down electron-beam lithography and bottom up self assembly of Au nanoparticles. Evaluation of magnetic bits were performed on purely top-down approaches using both direct deposition and ion milling processes. Measurements of BPM performance were performed to investigate the effects of trench material, and process conditions.

Metrics

1 Record Views

Details

Logo image