Abstract
This paper presents a simple and direct method for computing the charge collection probability distribution by utilizing the reciprocity theorem. The proposed method simplifies the charge collection probability computation with the use of the finite difference method. We demonstrate the method by computing the charge collection probability distribution of two finite junction configurations, the L-shaped and the U-shaped junction wells, and comparing the computational results with that obtained from the analytical expression as well as with the experiment. Good agreements were found. This method has the potential of advancing our understanding of photovoltaic devices as well as semiconductor characterization techniques, which make use of the charge collection process.