Adhesion Microscopy as a Nanoscale Probe for Oxidation and Charge Generation at Metal-Oxide Interfaces

Journal article

Peer reviewed

Alok Ranjan, Andrea Padovani, Behnood Dianat, Nagarajan Raghavan, Kin Leong Pey and Sean J. O’Shea

ACS applied electronic materials, Vol.5(9), pp.5176-5186

26/09/2023

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https://doi.org/10.1021/acsaelm.3c00903View

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Title: Adhesion Microscopy as a Nanoscale Probe for Oxidation and Charge Generation at Metal-Oxide Interfaces
Creators - without role: Alok Ranjan - Chalmers University of Technology
Andrea Padovani - University of Modena and Reggio Emilia
Behnood Dianat - University of Modena and Reggio Emilia
Nagarajan Raghavan - Singapore University of Technology and Design
Kin Leong Pey - Singapore University of Technology and Design
Sean J. O’Shea - Institute of Materials Research and Engineering
Publication Details: ACS applied electronic materials, Vol.5(9), pp.5176-5186
Number of pages: 11
Identifiers: 9912357809846
Academic Unit: EPD Pillar
Language: English
Resource Type: Journal article