An analysis of the factors affecting the alpha parameter used for extracting surface recombination velocity in EBIC measurements

Journal article

Peer reviewed

Oka Kurniawan and Vincent K. S Ong

Solid-state electronics, Vol.50(3), pp.345-354

01/03/2006

Abstract

Charge carriers: generation, recombination, lifetime, and trapping

Condensed matter: electronic structure, electrical, magnetic, and optical properties

Conductivity phenomena in semiconductors and insulators

Electronic transport in condensed matter

Exact sciences and technology

Physics

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Title: An analysis of the factors affecting the alpha parameter used for extracting surface recombination velocity in EBIC measurements
Creators - without role: Oka Kurniawan - Nanyang Technological University
Vincent K. S Ong - Nanyang Technological University
Publication Details: Solid-state electronics, Vol.50(3), pp.345-354
Publisher: Elsevier Science
Number of pages: 10
Identifiers: 9912334709846
Academic Unit: ISTD Pillar
Language: English
Resource Type: Journal article