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Characterization of high-density bit-patterned media using ultra-high resolution magnetic force microscopy
Journal article   Peer reviewed

Characterization of high-density bit-patterned media using ultra-high resolution magnetic force microscopy

S. N. Piramanayagam, M. Ranjbar, R. Sbiaa, A. Tavakkoli K G and T. C. Chong
Physica status solidi. PSS-RRL. Rapid research letters, Vol.6(3), pp.141-143
01/03/2012

Abstract

Materials Science Materials Science, Multidisciplinary Physical Sciences Physics Physics, Applied Physics, Condensed Matter Science & Technology Technology
Bit-patterned media at one terabit-per-square-inch (Tb/in2) recording density require a feature size of about 12 nm. The fabrication and characterization of such magnetic nanostructures is still a challenge. In this Letter, we show that magnetic dots can be resolved at 10 nm spacing using magnetic force microscopy (MFM) tips coated with a magnetic film possessing a perpendicular magnetic anisotropy (PMA). Compared to MFM tips with no special magnetic anisotropy, MFM tips with PMA can resolve the bits clearly, because of a smaller magnetic interaction volume, enabling a simple technique for characterizing fine magnetic nanostructures. (C) 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)

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