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Correlation of structural and magnetic properties of ferromagnetic Mn-implanted Si1-xGex films
Journal article   Peer reviewed

Correlation of structural and magnetic properties of ferromagnetic Mn-implanted Si1-xGex films

V. Ko, K. L. Teo, T. Liew, T. C. Chong, T. Liu, A. T. S. Wee, A. Y. Du, M. Stoffel and O. G. Schmidt
Journal of applied physics, Vol.103(5), 053912
01/03/2008

Abstract

Physical Sciences Physics Physics, Applied Science & Technology
We present a comprehensive study relating the magnetic properties to structural properties of Mn+-implanted Si1-xGex films as a function of Ge content (x=0-0.5). Ferromagnetic ordering with three critical temperatures, T-B similar to 10-16 K, T-C1 similar to 650-780 K, and T-C2 similar to 825-860 K, are reported in this material system. Element specific x-ray absorption fine structure results show that the majority of the Mn ions are nonsubstitutional in all samples. The transmission-electron microscopy coupled with z contrast and chemical analysis reveals the presence of Mn-rich nanosized clusters including Mn4Si7 in Si-rich samples and Mn7Ge3 phases in Ge-rich samples. A composition transition occurred at x similar to 0.2-0.3, where we observe a change in bond lengths and defect structures. Additionally, an enhancement in magnetizations with an increase in both T-B and T-C1 as well as a conversion from n-type to p-type conduction are also detected. (c) 2008 American Institute of Physics.

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