Determination of diffusion lengths with the use of EBIC from a diffused junction with any values of junction depths

Journal article

Peer reviewed

Oka Kurniawan and Vincent K. S Ong

IEEE transactions on electron devices, Vol.53(9), pp.2358-2363

01/09/2006

Abstract

Applied sciences

Compound structure devices

Electronics

Exact sciences and technology

Optoelectronic devices

Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

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Title: Determination of diffusion lengths with the use of EBIC from a diffused junction with any values of junction depths
Creators - without role: Oka Kurniawan - Nanyang Technological University
Vincent K. S Ong - Nanyang Technological University
Publication Details: IEEE transactions on electron devices, Vol.53(9), pp.2358-2363
Publisher: Institute of Electrical and Electronics Engineers
Number of pages: 6
Identifiers: 9912335209846
Academic Unit: ISTD Pillar
Language: English
Resource Type: Journal article