Abstract
A solid polythiophene pellet was ablated by a KrF excimer laser beam to deposit thin films on silicon substrates. The laser-ablated plasma was studied by optical emission spectroscopy to identify the photon-breaking of C–S bonds in the ablated heterocycles. Raman and x-ray photoelectron spectroscopy measurements of the deposited thin films also supported the selective photon-induced bond breaking. After eliminating sulfur in the molecular structures, the thin films appeared to be composed of cubic nanocrystals with a uniform size of 240 nm. X-ray diffraction measurement determined the cubic crystal structures with a lattice constant of α =3.38 Å and suggested a quasi-onedimensional carbon chain structure along the body diagonal of the cube.