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Hybrid-Mode SRAM Sense Amplifiers: New Approach on Transistor Sizing
Journal article   Peer reviewed

Hybrid-Mode SRAM Sense Amplifiers: New Approach on Transistor Sizing

Do Do Anh-Tuan, Kong Kong Zhi-Hui, Yeo Kiat-Seng Yeo Kiat-Seng and Kiat Seng Yeo
IEEE transactions on circuits and systems. II, Express briefs, Vol.55(10), pp.986-990
01/10/2008

Abstract

High speed Robustness Semiconductor devices Sense amplifiers Sizing Static random access memory Transistors Voltage
A novel high-speed sense amplifier for ultra-low-voltage SRAM applications is presented. It introduces a completely different way of sizing the aspect ratio of the transistors on the data-path, hence realizing a current-voltage hybrid mode Sense Amplifier. Extensive post-layout simulations have proved that the new Sense Amplifier provides both high-speed and low-power properties, with its delay and power reduced to 25.8% and 37.6% of those of the best prior art. It also offers a much better read-effectiveness and robustness against the bit- and data-line capacitances as well as V sub(DD) variations. Furthermore, the new Sense Amplifier is able to tolerate a large difference between the parasitic capacitances associated with the complementary DLs. It can operate down to a supply voltage of 0.9 V, the lowest reported for a 0.18 mum CMOS process. A modified cross-coupled amplifier is also introduced, allowing the Sense Amplifier to operate down to 0.55 V.

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