Introduction to the special issue on selected work from the 31st International Symposium on the physical and failure analysis of integrated circuits (IPFA 2024)

Journal article

Peer reviewed

Microelectronic engineering, Vol.301, p.112398

02/01/2026

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Title: Introduction to the special issue on selected work from the 31st International Symposium on the physical and failure analysis of integrated circuits (IPFA 2024)
Creators - without role: Samuel Chef - Nanyang Technological University
Nagarajan Raghavan - Singapore University of Technology and Design
Publication Details: Microelectronic engineering, Vol.301, p.112398
Publisher: Elsevier B.V
Identifiers: 9912483809846
Academic Unit: EPD Pillar
Language: English
Resource Type: Journal article