Abstract
We have developed a two-dimensional (2D) non-uniform model to study the space charge limited (SCL) current injection into a trap-filled solid of nano-contact, such as organic materials and dielectrics. Assuming a solid of length D with a contact of width W, the enhancement over the well-known 1D uniform model is calculated as a function of W/D for different material properties, such as the dielectric constant (epsilon) and the trap distribution. The non-uniform current density profile due to edge effect is predicted. The findings reported here are different from the prior uniform 2D models, which are significant for small W/D when the size of the contact reaching nanometer scale, i.e. W=50 nm for D=1 mu m. This model will be useful for the characterization of carrier mobility and properties of traps, which are critical to many novel devices (with small nano-contact) operating in the space charge limited condition reporting in novel device and its applications. Empirical formulas are given for future comparison with experimental results.