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Optical nonlinearities in ultra-silicon-rich nitride characterized using z-scan measurements
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Optical nonlinearities in ultra-silicon-rich nitride characterized using z-scan measurements

Byoung-Uk Sohn, Ju Won Choi, Doris K. T. Ng and Dawn T. H. Tan
Scientific reports, Vol.9(Jul (E-published)), pp.10364-7
17/07/2019
PMID: 31316096

Abstract

Multidisciplinary Sciences Science & Technology Science & Technology - Other Topics
The dispersive nonlinear refractive index of ultra-silicon-rich nitride, and its two-photon and three-photon absorption coefficients are measured in the wavelength range between 0.8 mu m-1.6 mu m, covering the O- to L-telecommunications bands. In the two-photon absorption range, the measured nonlinear coefficients are compared to theoretically calculated values with a simple parabolic band structure. Two-photon absorption is observed to exist only at wavelengths lower than 1.2 mu m. The criterion for all-optical switching through the material is investigated and it is shown that ultra-silicon-rich nitride is a good material in the three-photon absorption region, which spans the entire O- to L-telecommunications bands.
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https://doi.org/10.1038/s41598-019-46865-7View
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