Abstract
This study analyzes the regulatory mechanism of oxygen vacancy concentration on tail-to-tail charged domain walls (T-T CDWs), along with the writing time, conduction current magnitude, and retention performance of through-type T-T CDWs. The research results show that the highest density and length of T-T CDWs are achieved when the oxygen vacancy concentration is 1 x 10(20) cm(-3). Moreover, the successful writing of through-type T-T CDWs is limited to a certain electric field range, which is controlled by oxygen vacancy concentration. An increase in the oxygen vacancy concentration leads to a decrease in the maximum and minimum threshold electric fields required for writing through-type charged domain walls. The writing time and conductivity of through-type T-T CDWs determine the information writing speed and signal strength of domain wall memories, and the oxygen vacancy concentration also plays a regulatory role in both aspects. When the oxygen vacancy concentration is 1 x 10(20) cm(-3), the through-type T-T CDW exhibits the fastest writing speed, requiring only 8 ns. The magnitude of the conduction current of through-type T-T CDWs is directly proportional to the oxygen vacancy concentration. The through-type T-T CDWs formed by the aggregation of oxygen vacancies exhibit excellent retention performance, making them highly promising for applications in ferroelectric domain wall memories. Our research demonstrates that oxygen vacancies have a significant regulatory effect on the morphology and current response of charged domain walls, opening up new avenues for the study of domain wall memories. (c) 2024 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution-NonCommercial-NoDerivs 4.0 International (CC BY-NC-ND) License. (https://creativecommons.org/licenses/by-nc-nd/4.0/).