- Title
- RF equivalent-circuit model of interconnect bends based on S-parameter measurements
- Creators - without role
- Xiaomeng Shi - Nanyang Technological UniversityJianguo Ma - Nanyang Technological UniversityBeng Hwee Ong - Nanyang Technological UniversityKiat Seng Yeo - Nanyang Technological UniversityManh Anh Do - Nanyang Technological UniversityErping Li - Institute of High Performance Computing
- Publication Details
- Microwave and optical technology letters, Vol.45(2), pp.170-173
- Publisher
- Wiley Subscription Services, Inc., A Wiley Company
- Number of pages
- 4
- Identifiers
- 9912506809846
- Academic Unit
- Office of Provost
- Language
- English
- Resource Type
- Journal article
Journal article
RF equivalent-circuit model of interconnect bends based on S-parameter measurements
Microwave and optical technology letters, Vol.45(2), pp.170-173
20/04/2005
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