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Relationships between common source, common gate, and common drain FETs
Journal article   Peer reviewed

Relationships between common source, common gate, and common drain FETs

Jianjun Gao, G Boeck and ShaoYing Huang
IEEE transactions on microwave theory and techniques, Vol.53(12), pp.3825-3831
01/12/2005

Abstract

Aluminum gallium arsenides Drains Gallium arsenide Gates Mathematical models Noise Semiconductor devices Transistors
This paper comprehensively analyzes the relationship between common source (CS), common gate (CG), and common drain (CD) field-effect transistors (FETs). The signal and noise parameters of the CG and CD configuration can be obtained directly by using a simple set of formulas from CS signal and noise parameters. All the relationships provide a bi-directional bridge for the transformation between CS, CG, and CD FETs. This technique is based on the combination of an equivalent-circuit model and conventional two-port network signal/noise correlation matrix technique. The derived relationships have universal validity, but they have been verified at 240 mu m gatewidth (number of gate fingers unit gatewidth) double-heterojunction delta -doped AlGaAs/InGaAs/GaAs pseudomorphic high electron-mobility transistor with 0.25- mu m gate length. Good agreement has been obtained between calculated and measured results.

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