Sensitivity Analysis of Coupled Interconnects for RFIC Applications

Journal article

Peer reviewed

Xiaomeng Shi, Kiat Seng Yeo, Jian-Guo Ma, Manh Anh Do and Er-Ping Li

IEEE transactions on electromagnetic compatibility, Vol.48(4), pp.607-613

01/11/2006

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Title: Sensitivity Analysis of Coupled Interconnects for RFIC Applications
Creators - without role: Xiaomeng Shi - Nanyang Technological University
Kiat Seng Yeo - Nanyang Technological University
Jian-Guo Ma
Manh Anh Do
Er-Ping Li
Publication Details: IEEE transactions on electromagnetic compatibility, Vol.48(4), pp.607-613
Number of pages: 7
Identifiers: 9911710909846
Academic Unit: Office of Provost
Language: English
Resource Type: Journal article