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Journal article
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The effects of current spreading in the semiconductor on the determination of contact resistance
S.J. Chua
,
T.C. Chong
,
S.H. Lee
and
Y.S. Wang
Show details for 4 authors
Solid-state electronics, Vol.33(8), pp.1110-1112
01/08/1990
DOI:
https://doi.org/10.1016/0038-1101(90)90227-6
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Title
The effects of current spreading in the semiconductor on the determination of contact resistance
Creators - without role
S.J. Chua - National University of Singapore
T.C. Chong - Duke-NUS Medical School
S.H. Lee - National University of Singapore
Y.S. Wang - Harris Semiconductor (S) Pte Ltd 105 Boon Keng Road, No. 03-01 Singapore 1233
Publication Details
Solid-state electronics, Vol.33(8), pp.1110-1112
Publisher
Elsevier Ltd
Number of pages
3
Identifiers
9911284809846
Academic Unit
Temasek Lab
Language
English
Resource Type
Journal article
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