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The radial distribution of defects in a percolation path
Journal article   Peer reviewed

The radial distribution of defects in a percolation path

X. Li, C. H. Tung and K. L. Pey
Applied physics letters, Vol.93(26), pp.262902-262902-3
29/12/2008
DOI: https://doi.org/10.1063/1.3056659

Abstract

Physical Sciences Physics Physics, Applied Science & Technology
Our results show that the defect distribution within a nanometer size percolation path is nonuniform. The defects, which are shown as oxygen vacancies, spread out radially from the center of the percolation path. The conduction band edges of the defective oxide are lowered for 0.14-0.78 eV when the Si-O composition changes from SiO1.76 to SiO0.7.

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