Abstract
The thermal stability of highly oriented longitudinal thin film media was studied via micromagnetic modeling. 3D writing head field was used to write recording patterns on highly oriented media. The thermal energy barrier for the simulated recording bits was analyzed. It was found that highly oriented media has a higher energy barrier and the energy barrier reduces with the reduction of orientation ratio. Monte Carlo method was combined with micromagnetic modeling to simulate the time decay of the magnetization. It was found that highly oriented media shows slower magnetization decay rate at both zero magnetic field and a reverse magnetic field simulating the demagnetization field in recording bit. The higher the orientation ratio, the slower the magnetization decay rates