Thickness Dependent Nano-Crystallization in Ge 2 Sb 2 Te 5 Films and Its Effect on Devices

Journal article

Peer reviewed

Wei Chong, Zhao Koon and Tow Chong Chong

Japanese Journal of Applied Physics, Vol.46(4S), p.2211

01/04/2007

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Title: Thickness Dependent Nano-Crystallization in Ge 2 Sb 2 Te 5 Films and Its Effect on Devices
Creators - without role: Wei Chong
Zhao Koon
Tow Chong Chong - Temasek Lab
Publication Details: Japanese Journal of Applied Physics, Vol.46(4S), p.2211
Identifiers: 9911286509846
Academic Unit: Temasek Lab
Language: English
Resource Type: Journal article